M03900 - SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals StdPbc-0716 and measurement of the resulting

and measurement of the resulting layers so that meaningful comparisons can be made between various lots of semi-insulating GaAs

SEMI E111-0305 (technical revision)

and robotics has already been published as SEMI M74

This Standard describes procedures for measuring adhesive strength between leadframes and molding compounds for semiconductor packages

2 3インチ鏡面研磨単結晶シリコンウェーハ（セカンダリフラットあり）

M03900 - SEMI M39 - Test Method for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Semi-Insulating GaAs Single Crystals StdPbc-0716 and measurement of the resultingThis test method was technically approved by the global Compound Semiconductor Committee and is the direct responsibility of the Japanese Compound Semiconductor Committee. Current edition approved by the Japanese Regional Standards Committee on June 1, 1999. Initially available at www. semi. org August 1999; to be published September 1999. The purpose of this document is to specify a method to measure resistivity and determine Hall mobility of semi