HB00700 - SEMI HB7 - Test Method for Measurement of Waviness of Crystalline Sapphire Wafers by Using Optical Probes Revision:SEMI HB7-0615 - Current The purpose of this Standard

The purpose of this Standard is to provide recommendations for developing and delivering equipment training so that it is performance-based

This Document is a guide to a test method to determine gas change/purge efficiency of gas delivery system

SEMI M56-1018 (technical revision)

The pellicle exclusion volumes of this Specification accommodate pellicles which extend the full length of the reticle and up to a maximum pellicle width of 124 mm

org in November 2004

HB00700 - SEMI HB7 - Test Method for Measurement of Waviness of Crystalline Sapphire Wafers by Using Optical Probes Revision:SEMI HB7-0615 - Current The purpose of this StandardThis Standard was technically approved by the HB LED Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on May 19, 2015. Available at www. semiviews. org and www. semi. org in June 2015. Crystalline sapphire wafers (CSW) are used as substrates for manufacturing compound semiconductor devices, in particular high brightness light emitting diodes (HB LED). In SEMI HB1 a multitude of