G08000 - SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment Revision:SEMI G80-0200 - Superseded SEMI D32 — Specification for

SEMI D32 — Specification for Improved Information Management for Glass FPD Substrates through Orientation Corner Unification

4  This Specification defines a way for users to make ad hoc

The use of AFM for measuring the roughness of polymer surfaces is outlined in this test method

are insufficiently established to allow an unambiguous specification

Alternate-Direction

G08000 - SEMI G80 - Test Method for the Analysis of Overall Digital Timing Accuracy for Automated Test Equipment Revision:SEMI G80-0200 - Superseded SEMI D32 — Specification forNOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met. Inactive Standards or Safety Guidelines are available from SEMI and continue to be valid for use. This procedure will define a standard process whereby any logic integrated circuit (IC) automatic test equipment (ATE) system can be evaluated for parameters that makeup an alternating current (AC) timing accuracy