Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test Ingestion-build-258901 BS EN 61076-4-115:2003 has been

BS EN 61076-4-115:2003 has been superseded by BS EN 61326-2-3:2013

Television service providers

This standard has been written for manufacturers of health software

operating and maintaining the equipment in the manner prescribed by the manufacturer

additional measures might need to be taken to those recommended in this standard

Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test Ingestion-build-258901 BS EN 61076-4-115:2003 has been1 Scope This part of IEC 60749 provides a steady state temperature and humidity bias life test for the purpose of evaluating the reliability of non hermetic packaged solid state devices in humid environments. This test method is considered destructive.