Semiconductor devices. Mechanical and climatic test methods - Standard reliability testing methods of non-volatile memory devices Ingestion-build-46800 are not included in the

are not included in the results

For new installations the design should be to EN 12464-1

BS 4258-5:1989 includes a technical change with respect to BS 4258-5:1975

Annotea [2]

but it is strongly recommended that expert advice be taken before such use

Semiconductor devices. Mechanical and climatic test methods - Standard reliability testing methods of non-volatile memory devices Ingestion-build-46800 are not included in the1 Scope This Part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge based methods such as in JESD94.