Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-264231 they are decisive for the

they are decisive for the possible applications of the material

Developing and implementing a BCM response

This part of ISO/TR 10064 applies to bevel gear components as defined in ISO 17485

Components and parts used in such systems should be clean prior to assembly

4 Materials for sampling equipment

Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere Ingestion-build-264231 they are decisive for the1 Scope This PART of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.